Dr. Yung-Chang Lin is a Senior Researcher at the Nanomaterials Research Institute of Japan’s National Institute of Advanced Industrial Science and Technology (AIST). Specializing in transmission electron microscopy (TEM, STEM, EELS, EDX) and two-dimensional materials, Dr. Lin’s research career at AIST began in 2012 with a postdoctoral position under the JST Research Acceleration Project. Promoted to a full researcher role in 2015 and to Senior Researcher in 2019, Dr. Lin has established a reputation for pioneering discoveries in nanostructures and their properties.

His research contributions include the development of novel S/TEM characterization techniques, single-atom spectroscopy, and the correlation of nanostructures with material optical and electrical properties. His publications, exceeding 90 with over 12,000 citations (h-index 47, i10-index 84), reflect his influence in the field. Known for his intellectual creativity and focus, Dr. Lin has delivered more than 15 invited talks and remains a leading figure in advancing our understanding of nanomaterials through in-situ S/TEM techniques.