A Fellow of Oak Ridge National Laboratory (ORNL) , the Microscopy Society of America (MSA) , the Microanalysis Society (MAS)  as well as a Lifetime Honorary member of the Australian Microscopy and Microanalysis Society (AMMS), and member of the Microscopy New Zealand (MNZ) , Zaluzec has and continues to hold the tripartite role of Electron Metrologist of Energy and Quantum Materials, Educator and Inventor at the University of Chicago. As an innovator, his research includes development state-of-the art of instrumentation and techniques for atomic resolution x-ray & electron spectroscopy, and electron microscopy. In addition to creating tools for science, as a researcher he also uses these bleeding edge technologies to study vexing problems in technologically important materials. His work over the last 50 years has included studies in the areas of structural phase transformation in metals, radiation damage in alloys, ceramic oxides for geologic immobilization of nuclear waste materials, elemental segregation in a wide range of materials ranging from metals and catalysts to semiconductors and superconductors, magnetic dichroism, studies of optical photovoltaics and plasmonics in coupled and hybrid nanostructures, photo-catalysts, bio-materials, the interaction of particles in nanofluidic systems, and materials for quantum engineering and energy storage. He continues to investigate how aberration-corrected instruments can be re-engineered to improve the sensitivity of spectroscopy in analytical, multi-modal, multi-dimensional , in-situ studies of hard and soft materials.